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$beta$-Ga2O3 in Power Electronics Converters - Opportunities & Challenges

MetadataDetails
Publication Date2024-01-01
JournalIEEE Open Journal of Power Electronics
AuthorsSaeed Jahdi, Akhil S. Kumar, Matthew Deakin, Phil Taylor, Martin Kuball
InstitutionsNewcastle University, University of Bristol
Citations26
AnalysisFull AI Review Included

Technical Documentation & Analysis: $\beta$-Ga${2}$O${3}$/Diamond for UWBG Power Converters

Section titled “Technical Documentation & Analysis: $\beta$-Ga${2}$O${3}$/Diamond for UWBG Power Converters”

This analysis of the research on $\beta$-Ga${2}$O${3}$ in power electronics converters confirms that CVD Diamond Substrates are essential for realizing the full potential of Ultra-Wide-Bandgap (UWBG) devices in high-power applications (MVDC/HVDC).

  • UWBG Potential: $\beta$-Ga${2}$O${3}$ exhibits a theoretical Baliga’s Figure of Merit (BFOM) of 40 GW/cm$^{2}$, significantly exceeding SiC and GaN, making it ideal for high-voltage (up to 320 kV) power conversion.
  • Thermal Bottleneck: Bulk $\beta$-Ga${2}$O${3}$ suffers from extremely poor thermal conductivity (0.2 W/cm.K), leading to high case temperatures (up to 350 °C) and poor performance in early devices.
  • Diamond Solution: Heterogeneous integration of $\beta$-Ga${2}$O${3}$ with high Thermal Conductivity Diamond (TCD > 20 W/cm.K) substrates is the proven strategy to reduce thermal resistance ($R_{th}$) by up to 100x.
  • Performance Gains: $\beta$-Ga${2}$O${3}$/Diamond devices (experimental and theoretical) show significantly lower power losses and case temperatures compared to incumbent Si-IGBT and SiC-FET modules in both MVDC and HVDC systems.
  • Future Structures: Theoretical $\beta$-Ga${2}$O${3}$/Diamond Superjunction (SJ) structures promise the lowest switching energy ($E_{sw}$) and highest efficiency, validating the need for high-quality CVD diamond platforms.
  • 6CCVD Relevance: 6CCVD provides the necessary high-purity Single Crystal Diamond (SCD) and large-area Polycrystalline Diamond (PCD) substrates, along with custom metalization and polishing, required to manufacture these next-generation UWBG devices.

The following data points highlight the critical material properties and performance metrics analyzed in the study, emphasizing the role of diamond integration.

ParameterValueUnitContext
$\beta$-Ga${2}$O${3}$ Bandgap ($E_{G}$)4.8eVUltra-Wide Bandgap (UWBG)
$\beta$-Ga${2}$O${3}$ Critical Field ($E_{C}$)8MV/cmTheoretical maximum for high $V_{BR}$
$\beta$-Ga${2}$O${3}$ BFOM (Theoretical)40GW/cm$^{2}$4x GaN, 10x SiC (Material level)
Bulk $\beta$-Ga${2}$O${3}$ Thermal Conductivity0.2W/cm.KPrimary limitation for power applications
Diamond Thermal Conductivity> 20W/cm.KUsed for heat extraction and $R_{th}$ reduction
NiOx/$\beta$-Ga${2}$O${3}$ (Exp. 2022) $R_{ON}$0.2x-Relative to SiC baseline
$\beta$-Ga${2}$O${3}$/Diamond SJ (Theo. 2021) $E_{sw}$0.02x-Lowest relative switching energy (2% of SiC baseline)
$\beta$-Ga${2}$O${3}$/Diamond $R_{th}$ Reduction0.1*x-Relative thermal resistance (100x lower than bulk $\beta$-Ga${2}$O${3}$)
MVDC System Voltage6kVDistribution level converter testbed
HVDC System Voltage320kVTransmission level converter testbed
HVDC Module Case Temperature (Bulk $\beta$-Ga${2}$O${3}$)> 350°CObserved in inverter mode (sub-optimal)
HVDC Module Switching Frequency50 - 72HzTypical operation range for VSC-MMC

The study employed circuit and system-level simulations based on state-of-the-art device data to compare different generations of $\beta$-Ga${2}$O${3}$ against incumbent technologies in high-power converter topologies.

  1. Device Data Aggregation: Best reported experimental and theoretical parameters ($R_{ON}$, $V_{BR}$, $E_{sw}$, $R_{th}$) for various $\beta$-Ga${2}$O${3}$ structures (SBD, NiOx/$\beta$-Ga${2}$O${3}$, $\beta$-Ga${2}$O${3}$/Diamond) were extracted from literature.
  2. Thermal Management Modeling: The critical role of diamond integration was modeled by assuming $\beta$-Ga${2}$O${3}$ epitaxially grown on diamond, resulting in a thin epitaxial region (100 times thinner than bulk) to achieve a relative thermal resistance ($R_{th}$) of 0.1*x.
  3. Topology Selection: Modular Multilevel Converter (MMC) Voltage-Sourced Converter (VSC) half-bridge topology was selected as the principal architecture due to its relevance in MVDC (6 kV) and HVDC (320 kV) transmission systems.
  4. Loss Calculation: System conditions (load current, voltage) were used to determine module utilization factor and switching frequency (50 Hz to 198 Hz). Conduction and switching losses were calculated using temperature and current-dependent look-up tables.
  5. Thermal Analysis: A thermal model derived from datasheet thermal impedance characteristics was used to calculate the junction temperature ($T_{j}$) rise ($\Delta T$) and subsequent impact on device losses.
  6. Future Device Simulation: Theoretical performance of advanced structures, specifically $\beta$-Ga${2}$O${3}$/Diamond Superjunction (SJ) Schottky diodes, was simulated to project maximum efficiency gains.

The research clearly identifies high-quality diamond substrates as the enabling technology for commercially viable $\beta$-Ga${2}$O${3}$ power devices. 6CCVD is uniquely positioned to supply the necessary CVD diamond materials and customization services to accelerate this research into production.

Research Requirement (Jahdi et al.)6CCVD Solution & CapabilityTechnical Advantage
High Thermal Conductivity SubstrateOptical Grade Single Crystal Diamond (SCD) or High-Purity Polycrystalline Diamond (PCD) substrates.Provides TCD > 20 W/cm.K, essential for mitigating the 0.2 W/cm.K thermal bottleneck of $\beta$-Ga${2}$O${3}$ and achieving the simulated $R_{th}$ reduction.
Thin-Film Integration & BondingSCD/PCD wafers available in custom thicknesses from 0.1 µm up to 500 µm. Substrates available up to 10 mm thick.Supports the thin-film growth and exfoliation techniques required for heterogeneous integration, enabling the 100x reduction in thermal resistance cited in the study.
Large Area Device ScalingCustom dimensions for plates/wafers up to 125 mm (PCD).Meets the industry requirement for large-area power devices (e.g., > 100 A current rating) necessary for MVDC/HVDC module fabrication.
Heterogeneous Interface FabricationCustom Metalization Services: Au, Pt, Pd, Ti, W, Cu (Internal capability).Crucial for creating robust, low-resistance ohmic contacts and bonding layers required for the $\beta$-Ga${2}$O${3}$/Diamond interface and Superjunction (SJ) structures.
Surface Quality for Epitaxy/BondingUltra-smooth Polishing: Ra < 1 nm (SCD) and Ra < 5 nm (Inch-size PCD).Ensures the atomic-level flatness necessary for high-quality epitaxial growth or direct bonding of $\beta$-Ga${2}$O${3}$ thin films, minimizing detrimental thermal boundary resistance.
Advanced Structure DevelopmentEngineering Support: 6CCVD’s in-house PhD team can assist with material selection and design optimization for similar UWBG Thermal Management projects.Accelerates the realization of theoretical high-performance devices, such as the $\beta$-Ga${2}$O${3}$/Diamond Superjunctions, into experimental prototypes.

For custom specifications or material consultation, visit 6ccvd.com or contact our engineering team directly.

View Original Abstract

In this work, the possibility of using different generations of <inline-formula><tex-math notation=“LaTeX”>$\beta$</tex-math></inline-formula>-Ga<sub>2</sub>O<sub>3</sub> as an ultra-wide-bandgap power semiconductor device for high power converter applications is explored. The competitiveness of <inline-formula><tex-math notation=“LaTeX”>$\beta$</tex-math></inline-formula>-Ga<sub>2</sub>O<sub>3</sub> for power converters in still not well quantified, for which the major determining factors are the on-state resistance, <inline-formula><tex-math notation=“LaTeX”>$R_{\text{ON}}$</tex-math></inline-formula>, reverse blocking voltage, <inline-formula><tex-math notation=“LaTeX”>$V_{\text{BR}}$</tex-math></inline-formula>, and the thermal resistance, <inline-formula><tex-math notation=“LaTeX”>$R_{\text{th}}$</tex-math></inline-formula>. We have used the best reported device specifications from literature, both in terms of reports of experimental measurements and potential demonstrated by computer-aided designs, to study power converter performance for different device generations. Modular multilevel converter-based voltage source converters are identified as a topology with significant potential to exploit these device characteristics. The performance of MVDC &amp; HVDC converters based on this topology have been analysed, focusing on system level power losses and case temperature rise at the device level. Comparisons of these <inline-formula><tex-math notation=“LaTeX”>$\beta$</tex-math></inline-formula>-Ga<sub>2</sub>O<sub>3</sub> devices are made against contemporary SiC-FET and Si-IGBTs. The results have indicated that although the early <inline-formula><tex-math notation=“LaTeX”>$\beta$</tex-math></inline-formula>-Ga<sub>2</sub>O<sub>3</sub> devices are not competitive to incumbent Si-IGBT and SiC-FET modules, the latest experimental measurements on NiO<inline-formula><tex-math notation=“LaTeX”>$_\mathrm{X}$</tex-math></inline-formula>/<inline-formula><tex-math notation=“LaTeX”>$\beta$</tex-math></inline-formula>-Ga<sub>2</sub>O<sub>3</sub> and <inline-formula><tex-math notation=“LaTeX”>$\beta$</tex-math></inline-formula>-Ga<sub>2</sub>O<sub>3</sub>/diamond significantly surpass the performance of incumbent modules. Furthermore, parameters derived from semiconductor-level simulations indicate that the <inline-formula><tex-math notation=“LaTeX”>$\beta$</tex-math></inline-formula>-Ga<sub>2</sub>O<sub>3</sub>/diamond in superjunction structures delivers even superior performance in these power converters.

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