Combining new data-collection tools and improved beam delivery on the macromolecular crystallography beamline I04 at Diamond Light Source
At a Glance
Section titled âAt a Glanceâ| Metadata | Details |
|---|---|
| Publication Date | 2017-05-26 |
| Journal | Acta Crystallographica Section A Foundations and Advances |
| Authors | Ralf Flaig, Pierpaolo Romano, Jonathan Blakes, Chris Bloomer, Graham Duller |
| Institutions | Diamond Light Source |
| Analysis | Full AI Review Included |
Technical Documentation & Analysis: High-Precision Diamond Components for Macromolecular Crystallography Beamlines
Section titled âTechnical Documentation & Analysis: High-Precision Diamond Components for Macromolecular Crystallography BeamlinesâReference: Combining new data collection tools and improved beam delivery on the macromolecular crystallography beamline I04 at Diamond Light Source (Flaig et al., Acta Cryst. (2017). A73, a71)
Executive Summary
Section titled âExecutive Summaryâ6CCVD analyzes the I04 beamline upgrade at Diamond Light Source, identifying critical opportunities where high-purity MPCVD diamond is essential for achieving next-generation performance in X-ray optics and beam diagnostics.
- Application Focus: Upgrades to the I04 Macromolecular Crystallography (MX) beamline require enhanced stability and precision to handle increasingly challenging, small-sized samples.
- Precision Requirement: The system must reliably deliver and monitor beam sizes down to 10 ”m (horizontal) x 5 ”m (vertical).
- Critical Components: Key hardware upgrades include a new Double Crystal Monochromator (DCM) and advanced beam position/intensity monitors.
- Material Necessity: Future operational changes (increased ring current, lower emittance, higher power insertion devices) mandate materials with extreme thermal stability and radiation hardness.
- 6CCVD Solution: High-purity, low-birefringence Single Crystal Diamond (SCD) is the industry standard for high-heat load X-ray monochromators and windows, ensuring minimal thermal distortion.
- Diagnostic Opportunity: Boron-Doped Diamond (BDD) or high-purity SCD plates are ideal for robust, high-resolution beam position and intensity monitors operating under high flux.
Technical Specifications
Section titled âTechnical SpecificationsâThe following data points extracted from the research paper define the operational environment and component requirements for the I04 beamline upgrades:
| Parameter | Value | Unit | Context |
|---|---|---|---|
| Beamline Application | I04 | N/A | Macromolecular Crystallography (MX) |
| Energy Range (Tuneable) | 5 - 25 | keV | Wide operational range for SAD/MAD experiments |
| Energy Range (Core) | 6 - 17 | keV | Standard operating range |
| Minimum Beam Size (H x V) | 10 x 5 | ”m | Achieved via compound refractive lenses (CRL) |
| Maximum Beam Size (H x V) | 110 x 100 | ”m | CRL adjustment range |
| Monochromator Type | Double Crystal Monochromator (DCM) | N/A | Newly installed, designed for enhanced stability |
| Future Power Demand | Increased | N/A | Anticipated due to higher ring current and new insertion devices |
| Required Beam Delivery | Reliable, stringent intensity and position | N/A | Necessary for small sample sizes |
Key Methodologies
Section titled âKey MethodologiesâThe I04 beamline improvement program focuses on hardware and software integration to enhance beam delivery reliability and data collection efficiency.
- Beam Focusing System: Installation of an array of compound refractive lenses in a transfocator-like device, enabling rapid, wide-range adjustment of beam size (10x5 ”m to 110x100 ”m).
- Monochromator Upgrade: Implementation of a new, in-house designed Double Crystal Monochromator (DCM) based on proven technology, specifically engineered for increased stability under future high-power conditions.
- Beam Diagnostics and Feedback: Commissioning of new beam position and intensity monitors designed to integrate with a beam delivery feedback system for real-time stabilization.
- Goniometry Improvement: Planning for the installation of the SmarGon multi-axis goniometer to facilitate faster sample centring, improved helical scan performance, and multi-sweep data collection strategies.
- Software Development: Ongoing work on the user software interface to streamline and optimize complex user experiments.
6CCVD Solutions & Capabilities
Section titled â6CCVD Solutions & CapabilitiesâThe stringent requirements for thermal management, radiation hardness, and optical quality in synchrotron X-ray optics and diagnostics are perfectly matched by 6CCVDâs MPCVD diamond capabilities.
Applicable Materials
Section titled âApplicable MaterialsâTo replicate or extend the performance of the I04 beamline components, 6CCVD recommends the following materials:
| Component Application | Material Recommendation | Key 6CCVD Specification | Rationale |
|---|---|---|---|
| High-Heat Load Monochromator Crystals (DCM) | Optical Grade SCD (Single Crystal Diamond) | SCD thickness 100 ”m - 500 ”m; Ra < 1 nm polishing. | Highest thermal conductivity (22 W/cm·K) minimizes thermal distortion under high flux. Low defect density ensures optimal diffraction efficiency. |
| Beam Position/Intensity Monitors | High-Purity SCD or Boron-Doped Diamond (BDD) | SCD or PCD plates up to 125mm; Custom metalization (Au/Pt). | Radiation hardness and fast charge carrier mobility are critical for reliable, high-speed beam diagnostics. BDD offers uniform conductivity for sensor applications. |
| X-ray Windows/Filters | Optical Grade SCD or PCD | SCD thickness 50 ”m - 150 ”m. | Low Z material minimizes absorption while providing robust vacuum separation against high pressure differentials. |
Customization Potential
Section titled âCustomization Potentialâ6CCVD provides the necessary engineering flexibility to supply components tailored precisely to synchrotron specifications, ensuring seamless integration into existing beamline infrastructure like the I04 DCM and diagnostic systems.
- Custom Dimensions: We offer SCD and PCD plates/wafers up to 125mm in diameter, accommodating large-area diagnostic requirements.
- Precision Thickness Control: SCD and PCD layers can be grown and processed to precise thicknesses ranging from 0.1 ”m up to 500 ”m, essential for optimizing X-ray absorption and diffraction characteristics.
- Advanced Polishing: We guarantee ultra-low surface roughness (Ra < 1 nm for SCD; Ra < 5 nm for inch-size PCD), critical for minimizing scattering losses in X-ray optics.
- Integrated Metalization: 6CCVD offers in-house metalization services, including deposition of Au, Pt, Pd, Ti, W, and Cu. This capability is vital for creating ohmic contacts, electrodes, and bonding layers required for beam position monitors and detector arrays.
Engineering Support
Section titled âEngineering Supportâ6CCVDâs in-house PhD team specializes in the application of MPCVD diamond for high-energy physics and synchrotron optics. We can assist beamline engineers in material selection, orientation, and thermal modeling for similar High-Heat Load X-ray Optics and Beam Diagnostics projects. Our expertise ensures that the diamond material selected meets the stringent stability and power handling requirements necessitated by future increases in ring current and insertion device power output.
For custom specifications or material consultation, visit 6ccvd.com or contact our engineering team directly.
View Original Abstract
Diamond Light Source [1] currently operates five beamlines for macromolecular crystallography (MX) and soon seven beamlines will serve the MX user community [2].I04, a widely tuneable (5-25 keV, core range 6-17 keV) SAD/MAD station [3] is constantly evolving with the aim to provide the user with state of the art tools for data collection, especially to enable structure solution from increasingly difficult and challenging samples.Since early 2015 the beamline is using an array of compound refractive lenses in a transfocator like device allowing the user to quickly change the beam size from 10 (h) x 5 (v) up to 110 (h) x 100 (v) microns over a wide energy range and thus be better able to match the beam size to the crystal size or be able to select more precisely the best part of the crystal.Using these small beam sizes, especially with small sample sizes, requires much more stringent schemes in terms of reliable beam delivery with respect to beam intensity and position than were envisaged for the original beamline design, including the monochromator and beam diagnostics.We therefore have started a programme to improve beam delivery and have recently installed a new double crystal monochromator (DCM) which was designed inhouse based on existing proven technology and experience gained from other designs.The aim is to provide a system that is more stable, also taking into account possible future changes e.g. an increase in ring current, a lower emittance storage ring lattice and a new insertion device with higher power output.Alongside this, we have installed new beam position and intensity monitors that we are currently commissioning to be used in conjunction with a beam delivery feedback system.We are also looking into an improved goniometry and sample test system.As part of this we are planning the installation of the SmarGon multi-axis goniometer, which will enable better and faster sample centring, improved helical scan performance and provide users with new scientific capabilities for multi-sweep data collection strategies using multiple crystal orientations.Alongside these upgrades in beamline hardware we are also working on the development of the user software interface in order to streamline the user experiments.