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Dimer ribbon structures on diamond (001) surfaces revealed with atomic force microscopy

MetadataDetails
Publication Date2025-04-10
JournalPhysical Review Research
AuthorsRunnan Zhang, Y. Yasui, Masahiro Fukuda, Masahiko Ogura, Toshiharu Makino
InstitutionsThe University of Tokyo, National Institute of Advanced Industrial Science and Technology
AnalysisFull AI Review Included

Technical Documentation & Analysis: Atomic-Scale Diamond Surface Engineering

Section titled “Technical Documentation & Analysis: Atomic-Scale Diamond Surface Engineering”

This documentation analyzes the research paper, “Dimer ribbon structures on diamond (001) surfaces revealed with atomic force microscopy,” focusing on the material requirements and growth methodologies relevant to 6CCVD’s advanced MPCVD diamond products.


The research successfully utilized high-resolution near-contact Atomic Force Microscopy (AFM) and Density Functional Theory (DFT) to resolve long-standing contradictions regarding the atomic structure of diamond (001) surfaces grown via Chemical Vapor Deposition (CVD).

  • Core Achievement: Direct atomic-scale visualization of stable adatom configurations, specifically “dimer ribbons” composed of odd numbers of dimers, on clean, boron-doped homoepitaxial diamond (001).
  • Material Requirement: The study necessitated ultra-high quality, low-misorientation (< 0.1°) Boron-Doped Diamond (BDD) films grown homoepitaxially to ensure surface flatness and structural integrity for atomic imaging.
  • Scientific Impact: The findings provide a crucial foundation for optimizing diamond film growth processes, particularly for achieving optimal doping and surface flatness required for next-generation devices (e.g., high-frequency FETs, quantum sensors).
  • Methodology: The use of reactive Si tips in FM-AFM, combined with precise UHV annealing and hydrogen etching, enabled atomic resolution imaging previously challenging due to diamond’s insulating properties.
  • 6CCVD Value Proposition: 6CCVD specializes in providing the exact low-misorientation Single Crystal Diamond (SCD) and custom Boron-Doped Diamond (BDD) materials required to replicate and extend this foundational research into functional devices.

The following hard data points were extracted from the CVD growth and measurement parameters detailed in the study.

ParameterValueUnitContext
Substrate Misorientation< 0.1°Required for high-quality homoepitaxy
Film Thickness400nmResulting film thickness
Growth Temperature800°CSubstrate temperature during CVD
Microwave Power750WUsed for plasma generation
Microwave Frequency2.45GHzStandard industrial frequency
Total Gas Flow Rate400sccmH2, CH4, Trimethylborane (TMB)
Chamber Pressure25TorrCVD growth environment
C/H2 Ratio0.3%Carbon source concentration
B/C Ratio0.005%Boron doping concentration
UHV Annealing Temperature1020°CUsed for surface dehydration prior to AFM
AFM Cantilever Resonance~167kHzUsed for Frequency-Modulation AFM (FM-AFM)
AFM Cantilever Elasticity34.9N/mStiffness of Si tip
AFM Frequency Shift (Afs)-15 to -25HzSet point for atomic resolution imaging

The experiment relied on precise MPCVD growth followed by rigorous surface preparation to achieve the necessary atomic flatness and cleanliness for AFM imaging.

  1. Substrate Preparation: Ib diamond substrates with ultra-low misorientation (< 0.1°) were selected for homoepitaxial growth.
  2. MPCVD Growth: Boron-doped diamond films were synthesized using a gas mixture of H2, CH4, and Trimethylborane (TMB) at 25 Torr and 800 °C, resulting in 400 nm thick films over 4 hours.
  3. Hydrogen Etching: A subsequent hydrogen etching process (approximately 5 minutes) was performed to obtain a well-defined hydrogen-terminated surface.
  4. Dehydration Annealing: Films were annealed in an Ultrahigh Vacuum (UHV) chamber at 1020 °C for two hours (base pressure 5×10-9 Pa) to dehydrate the surface while preserving the carbon atom arrangement.
  5. AFM Imaging: Frequency-Modulation AFM (FM-AFM) was performed at room temperature using Ar ion sputtered, reactive Si tips to achieve near-contact atomic resolution, focusing on the maximum attractive force region.
  6. Theoretical Validation: Density Functional Theory (DFT) calculations were used to confirm the energetic stability of the observed dimer ribbon configurations (e.g., ABABA structure for five dimers, 47.95 eV formation energy).

This research highlights the critical need for highly controlled, low-defect diamond materials for fundamental surface science and advanced device fabrication. 6CCVD is uniquely positioned to supply the required materials and custom processing services.

To replicate the high-resolution surface analysis and extend this research into functional devices (e.g., high-power FETs or quantum sensors), 6CCVD recommends the following materials:

6CCVD MaterialSpecificationApplication Relevance
Optical Grade SCDMisorientation < 0.1°, Ra < 1 nm, Thickness 0.1 ”m - 500 ”mEssential for homoepitaxial growth and achieving the atomic flatness required for AFM/STM studies.
Custom Boron-Doped SCD (BDD)Precise B/C ratio control (e.g., 0.005% used in the paper), custom thickness up to 500 ”m.Required for replicating the electrical properties and growth kinetics of the studied material.
High-Purity SCD SubstratesPlates up to 125 mm (PCD equivalent size), low defect density.Provides the ideal foundation for large-area growth and scale-up of optimized processes.

6CCVD’s in-house MPCVD and processing capabilities directly address the specialized needs demonstrated in this paper:

  • Custom Doping Profiles: We offer precise control over Boron (B/C) ratios and thickness (0.1 ”m to 500 ”m) to match specific CVD recipes, allowing researchers to explore the impact of doping concentration on dimer ribbon stability and growth kinetics.
  • Ultra-Low Misorientation Substrates: We supply SCD substrates with misorientation angles significantly less than 0.1°, crucial for achieving the step-flow growth mode necessary for highly uniform surfaces.
  • Advanced Polishing: 6CCVD guarantees surface roughness (Ra) < 1 nm for SCD, ensuring the atomic-scale flatness required for high-resolution AFM and subsequent device fabrication.
  • Custom Metalization Services: While the paper focused on clean surfaces, future integration of these optimized films into FETs or sensors requires contacts. 6CCVD offers internal metalization capabilities, including Au, Pt, Pd, Ti, W, and Cu stacks, tailored to specific device architectures.

6CCVD’s in-house PhD team provides expert consultation on material selection, growth recipe optimization, and post-processing techniques (such as UHV annealing or hydrogen termination) for similar Diamond Surface Science and Semiconductor projects. We ensure global delivery with DDU default shipping, and DDP options are available upon request.

For custom specifications or material consultation, visit 6ccvd.com or contact our engineering team directly.

View Original Abstract

The potential of diamond films for future semiconductor applications is partly limited by current growth techniques. This limitation can be addressed by achieving an atomic-level understanding of the growth processes. Using atomic force microscopy with atomic resolution, we examined diamond surfaces and observed specific structures, where odd numbers of dimers form ribbonlike configurations. Formed in the nonequilibrium environment of plasma, these structures were evaluated as the most stable configurations through density-functional-theory calculations. Our findings provide a crucial foundation for optimizing the film growth process.

  1. 2001 - Properties, Growth and Applications of Diamond