High-Precision Mapping of Diamond Crystal Strain Using Quantum Interferometry
At a Glance
Section titled âAt a Glanceâ| Metadata | Details |
|---|---|
| Publication Date | 2022-02-15 |
| Journal | Physical Review Applied |
| Authors | Mason C. Marshall, Reza Ebadi, Connor Hart, Matthew Turner, Mark Ku |
| Institutions | University of Maryland, College Park, University of Delaware |
| Citations | 26 |
| Analysis | Full AI Review Included |
Technical Documentation & Analysis: High-Precision Diamond Strain Mapping
Section titled âTechnical Documentation & Analysis: High-Precision Diamond Strain MappingâThis document analyzes the research paper âHigh-precision mapping of diamond crystal strain using quantum interferometryâ and outlines how 6CCVDâs advanced MPCVD diamond materials and fabrication services can support, replicate, and extend this cutting-edge quantum sensing research.
Executive Summary
Section titled âExecutive SummaryâThis research establishes a new benchmark for diamond crystal strain measurement, leveraging Nitrogen Vacancy (NV) ensembles and a magnetic-field-insensitive quantum interferometry protocol (strain-CPMG).
- Record Sensitivity: Achieved a volume-normalized strain sensitivity of 5(2) x 10-8/âHz· ”m-3, representing a two order-of-magnitude improvement over previous work.
- Advanced Methodology: Utilized strain-sensitive spin-state interferometry (strain-CPMG) on NV ensembles in high-purity Single Crystal Diamond (SCD).
- Dual Imaging Modalities: Demonstrated micron-scale 3D strain mapping using a confocal microscope and high-speed, millimeter-scale wide-field imaging using a Quantum Diamond Microscope (QDM).
- Material Requirement: The experiment relied on high-quality, isotopically enriched 99.995% 12C CVD SCD with low strain gradients to maximize the strain-CPMG dephasing time (TD â 20 ”s).
- Robustness & Extension: The magnetic-field insensitivity of the strain-CPMG technique expands its utility, enabling precise strain measurements in diamonds with higher impurity (e.g., high-N or 13C content) where traditional ODMR methods fail.
- Key Applications: Provides essential characterization for diamond material engineering, nanofabrication, in situ strain sensing (e.g., diamond anvil cells), and future dark matter detection (WIMPs).
Technical Specifications
Section titled âTechnical SpecificationsâThe following hard data points were extracted from the experimental results and material characterization:
| Parameter | Value | Unit | Context |
|---|---|---|---|
| Volume-Normalized Strain Sensitivity | 5(2) x 10-8 | /âHz· ”m-3 | Record sensitivity achieved via strain-CPMG. |
| Material Purity (Carbon) | 99.995% | 12C | Isotopically purified SCD used for low strain and long TD. |
| SCD Dimensions (Chip) | 3.4 x 3.4 x 0.1 | mm3 | Dimensions of the bulk CVD diamond sections A and B. |
| Ensemble NV Dephasing Time (T2*) | 7.5 | ”s | Measured using standard Ramsey protocol. |
| Strain-CPMG Dephasing Time (TD) | ~20 | ”s | Enhanced coherence time due to magnetic field insensitivity. |
| Confocal Interrogation Volume | 0.54(2) | ”m3 | Used for quantitative sensitivity characterization. |
| Axial Spin-Strain Coupling (A1) | -8.0(5.7) | GHz/strain | Coupling constant for strain component Δzz. |
| Planar Spin-Strain Coupling (A2) | -12.4(4.7) | GHz/strain | Coupling constant for strain components (Δxx + Δyy). |
| QDM Field-of-View (Single Image) | ~150 x 150 | ”m2 | Used for high-speed, wide-field strain surveys. |
| QDM Acquisition Speed | 1 | second | Time required for high-sensitivity strain imaging per field-of-view. |
Key Methodologies
Section titled âKey MethodologiesâThe experiment relied on precise material selection and a specialized quantum control sequence to achieve magnetic-field insensitivity.
- Material Selection and Preparation: Used single-crystal CVD bulk diamond (SCD) grown via the {100} orientation, isotopically enriched with 12C. NV centers were formed post-growth via electron irradiation and annealing, resulting in densities of 0.3-0.5 ppm.
- NV Spin Control: NV ensembles were initialized using a 532 nm green laser and controlled using pulsed microwave (MW) fields broadcast via an omega-loop antenna fabricated on a glass coverslip.
- Strain-CPMG Sequence: A modified Carr-Purcell-Meiboom-Gill (CPMG) sequence was employed, optimized for strain sensing. This sequence uses triplets of Ï-pulses to swap NV populations between the |-1> and |+1> states, ensuring the accumulated phase is independent of the linear magnetic field term (ÎłBzSz).
- Strain Extraction: The strain-induced energy shift (Mz) was measured by monitoring the interferometric visibility (v) as a function of the common-mode MW detuning (ÎŽcm).
- Confocal Microscopy: A custom-built scanning confocal laser microscope was used to achieve micron-scale spatial resolution and 3D mapping capability, allowing for quantitative characterization of the volume-normalized sensitivity.
- Wide-Field Imaging (QDM): A Quantum Diamond Microscope (QDM) with a Heliotis HeliCam C3 lock-in camera was used for fast, wide-field strain surveys (millimeter-scale field-of-view). The XY-normalized visibility (vXY) protocol was used in the QDM to compensate for laser and MW power inhomogeneity across the large field-of-view.
6CCVD Solutions & Capabilities
Section titled â6CCVD Solutions & Capabilitiesâ6CCVD is uniquely positioned to supply the high-specification diamond materials and custom fabrication required to replicate and advance this quantum interferometry research.
| Research Requirement/Challenge | 6CCVD Solution & Capability | Technical Advantage |
|---|---|---|
| High-Purity SCD Material | Optical Grade Single Crystal Diamond (SCD): We supply low-strain, high-coherence SCD wafers and plates, ideal for NV ensemble quantum sensing. | Guarantees the low strain gradients and long TD necessary to achieve the reported record sensitivity (5 x 10-8/âHz· ”m-3). |
| Custom Dimensions & Thickness | Custom Fabrication Services: Plates/wafers up to 125 mm (PCD) and custom thicknesses: SCD (0.1 ”m - 500 ”m) and Substrates (up to 10 mm). | Allows researchers to specify exact geometries (e.g., 3.4 x 3.4 x 0.1 mm3 sections) for integration into confocal stages, QDM setups, or high-pressure diamond anvil cells. |
| Ultra-Smooth Surfaces | Precision Polishing: SCD polishing capability achieving surface roughness Ra < 1 nm. | Essential for minimizing optical scattering and maximizing the signal-to-noise ratio (SNR) required for high-fidelity NV initialization and fluorescence readout. |
| Integrated MW Structures | Custom Metalization: In-house deposition of standard metals including Au, Pt, Pd, Ti, W, and Cu. | Facilitates the integration of on-chip microwave antennas (like the omega-loop used in the experiment) or electrical contacts for advanced device architectures. |
| Strain Sensing in Impure Diamonds | Boron-Doped Diamond (BDD) & Polycrystalline Diamond (PCD): The strain-CPMG technique is robust against magnetic inhomogeneity, making it suitable for higher-N or 13C content materials. | Enables the use of cost-effective or specialized materials (BDD for electrochemistry, high-N PCD for industrial tools) where strain characterization is critical but high T2* is not achievable. |
| Engineering Support | In-House PhD Team Consultation: 6CCVD provides expert engineering support for material selection and specification. | Our team can assist with material selection for similar NV-based strain sensing projects, optimizing NV density and isotopic purity based on the required sensitivity and application environment. |
For custom specifications or material consultation, visit 6ccvd.com or contact our engineering team directly.
View Original Abstract
Crystal strain variation imposes significant limitations on many quantum\nsensing and information applications for solid-state defect qubits in diamond.\nThus, precision measurement and control of diamond crystal strain is a key\nchallenge. Here, we report diamond strain measurements with a unique set of\ncapabilities, including micron-scale spatial resolution, millimeter-scale\nfield-of-view, and a two order-of-magnitude improvement in volume-normalized\nsensitivity over previous work [1], reaching $5(2) \times\n10^{-8}/\sqrt{\rm{Hz}\cdot\rm{\mu m}^3}$ (with spin-strain coupling\ncoefficients representing the dominant systematic uncertainty). We use\nstrain-sensitive spin-state interferometry on ensembles of nitrogen vacancy\n(NV) color centers in single-crystal CVD bulk diamond with low strain\ngradients. This quantum interferometry technique provides insensitivity to\nmagnetic-field inhomogeneity from the electronic and nuclear spin bath, thereby\nenabling long NV ensemble electronic spin dephasing times and enhanced strain\nsensitivity. We demonstrate the strain-sensitive measurement protocol first on\na scanning confocal laser microscope, providing quantitative measurement of\nsensitivity as well as three-dimensional strain mapping; and second on a\nwide-field imaging quantum diamond microscope (QDM). Our strain microscopy\ntechnique enables fast, sensitive characterization for diamond material\nengineering and nanofabrication; as well as diamond-based sensing of strains\napplied externally, as in diamond anvil cells or embedded diamond stress\nsensors, or internally, as by crystal damage due to particle-induced nuclear\nrecoils.\n