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Peculiarities of the Acoustic Wave Propagation in Diamond-Based Multilayer Piezoelectric Structures as “Me1/(Al,Sc)N/Me2/(100) Diamond/Me3” and “Me1/AlN/Me2/(100) Diamond/Me3” under Metal Thin-Film Deposition

MetadataDetails
Publication Date2022-01-07
JournalElectronics
AuthorsГ. М. Квашнин, B. P. Sorokin, Nikita O. Asafiev, V.M. Prokhorov, A. V. Sotnikov
InstitutionsTechnological Institute for Superhard and Novel Carbon Materials, Leibniz Institute for Solid State and Materials Research
Citations8
AnalysisFull AI Review Included

Technical Documentation & Analysis: Diamond-Based HBAR Sensors

Section titled “Technical Documentation & Analysis: Diamond-Based HBAR Sensors”

Reference Paper: Kvashnin et al. (2022). Peculiarities of the Acoustic Wave Propagation in Diamond-Based Multilayer Piezoelectric Structures… Electronics 2022, 11, 176.


This research validates the use of Single Crystal Diamond (SCD) substrates in High Overtone Bulk Acoustic Resonators (HBARs) as a superior platform for ultra-sensitive, high-frequency acousto-electronic sensors.

  • Core Achievement: Successful fabrication and testing of diamond-based Multilayer Piezoelectric Structures (MPS) operating as mass sensors in the microwave band.
  • Material Validation: Synthetic Single Crystal Diamond (SCD) Type IIa substrates were confirmed to maintain exceptionally high Quality Factors (Q) up to 12,500 at frequencies near 20 GHz.
  • High Frequency Operation: The HBAR devices demonstrated stable operation and high Q-factors across the 1 GHz to 20 GHz range, with potential for extension up to 40 GHz, significantly exceeding conventional SAW or FBAR sensors.
  • Enhanced Sensitivity Mechanism: Optimal sensor sensitivity was achieved by exploiting the acoustic impedance mismatch between the diamond substrate (Zdiam) and the deposited metal film (Me3), particularly at specific quarter-wave thickness points.
  • Structure: The sensors utilized a five-layered structure: Me1/(Al,Sc)N/Me2/(100) diamond/Me3, requiring precise control over thin-film deposition and material properties.
  • Commercial Potential: The resulting diamond-based sensors offer enhanced sensitivity, chemical inertness, high temperature resistance, and potential for multiple applications, positioning them as a prospective platform for next-generation multipurpose sensors.

The following hard data points were extracted from the experimental results and modeling parameters:

ParameterValueUnitContext
Substrate MaterialSingle Crystal Diamond (SCD)N/AType IIa, (001) orientation
Operating Frequency Range1 to 20GHzTested range for HBAR sensor
Maximum Quality Factor (Q)~12,500N/AObserved at ~20 GHz
L-BAW Phase Velocity (Diamond)17,542m/sAlong [100] direction
Acoustic Impedance (Diamond)61.7 x 106kg/m2·sReference value for sensitivity calculation
Diamond Substrate Thickness482, 501, 629µmUsed in Sensors #A, #B, #C
Piezoelectric Layer Thickness930 to 1120nmAlN or Al1-xScxN
Sc Content in Piezoelectric Layer0 to 13%Used to enhance electromechanical excitation
Deposited Film Thickness (Me3)0 to 950nmRange studied for Sc, Mo, and Pt films
Electrode Materials (Me1, Me2, Me3)Al, Mo, Pt, ScN/AMetals used in the multilayer stack

The experimental procedure focused on precise material synthesis, thin-film deposition, and high-frequency acoustic characterization.

  1. Substrate Selection: Type IIa synthetic Single Crystal Diamond (SCD) plates with (001) orientation were chosen for their exceptionally low acoustic attenuation in the microwave band.
  2. Multilayer Structure Fabrication: HBAR sensors were realized as five-layered Multilayer Piezoelectric Structures (MPS): “Me1/(Al,Sc)N/Me2/(100) diamond/Me3”.
  3. Piezoelectric Transducer Deposition: Thin-film piezoelectric transducers (TFPT) of Aluminum Nitride (AlN) or Aluminum-Scandium Nitride (Al,Sc)N were applied to excite the Longitudinal Bulk Acoustic Wave (L-BAW).
  4. Metal Film Deposition (Me3): Films of Scandium (Sc), Molybdenum (Mo), and Platinum (Pt) were deposited onto the free side of the diamond substrate using AJA Orion 8 magnetron sputtering equipment.
  5. Thickness Metrology: Film thickness was controlled during sputtering via a Quartz Crystal Microbalance (QCM) sensor and verified post-deposition using Atomic Force Microscopy (AFM) on accompanying Si samples (measurement uncertainty 3 nm to 10 nm).
  6. Acoustic Characterization: The shift of the overtone’s resonant frequency (Δf/f) and Quality Factor (Q) were measured using an E5071C Agilent network analyzer. Overtones with the highest Q-factor were prioritized.
  7. Modeling and Simulation: Finite Element Method (FEM) simulations, utilizing COMSOL Multiphysics software, were performed to model 2D acoustic wave propagation and explain the observed dependencies based on acoustic impedance ratios.

6CCVD provides the foundational diamond materials and advanced processing required to replicate, optimize, and scale the diamond-based HBAR technology described in this research. Our expertise in MPCVD diamond growth and precision fabrication directly addresses the critical material requirements for high-performance acousto-electronic devices.

The high Q-factor performance relies entirely on the low acoustic attenuation of the diamond substrate. 6CCVD specializes in providing the necessary material quality:

  • Optical Grade Single Crystal Diamond (SCD): Required to match or exceed the Type IIa quality used in the study. Our SCD material offers extremely low defect density and surface roughness (Ra < 1 nm), ensuring minimal acoustic scattering and maximum Q-factor stability up to 40 GHz.
  • Custom Substrate Thickness: The paper utilized substrates up to 629 µm thick. 6CCVD offers SCD plates with thicknesses ranging from 0.1 µm up to 500 µm, and custom substrates up to 10 mm thick, allowing engineers to precisely tune the acoustic path length for specific overtone frequencies.
  • Precise Orientation: We guarantee precise (001) orientation control, which is critical for maximizing L-BAW excitation efficiency and predictability in the MPS stack.

Customization Potential for MPS Fabrication

Section titled “Customization Potential for MPS Fabrication”

Replicating the complex multilayer structure requires tight control over dimensions and metal interfaces. 6CCVD offers comprehensive services to streamline the fabrication process:

Research Requirement6CCVD CapabilityTechnical Advantage
Metalization (Me1, Me2, Me3)In-House Metal Deposition: We offer deposition of Au, Pt, Pd, Ti, W, and Cu.Directly supports the use of Pt and Mo (used in the study) and allows for optimization with other high-performance metals (e.g., Ti/Pt/Au stacks).
Custom Dimensions & AperturesPrecision Laser Cutting & Patterning: Plates/wafers up to 125 mm (PCD) and custom patterning for SCD.Enables precise definition of the 10,000 sq. micron aperture area and facilitates the scaling of HBAR arrays for commercial production.
Surface FinishUltra-Low Roughness Polishing: Ra < 1 nm (SCD).Essential for minimizing acoustic losses and ensuring high-quality, uniform deposition of the piezoelectric (AlN/AlScN) and metal films.
Global Supply ChainGlobal Shipping (DDU/DDP):Ensures rapid and reliable delivery of custom diamond substrates to research and manufacturing facilities worldwide.

The successful operation of the HBAR sensor depends on optimizing the acoustic impedance ratio (ZMe3 vs. Zdiam). 6CCVD’s in-house PhD team specializes in material science and acoustic properties of diamond. We can assist with:

  • Material Selection: Consulting on the optimal SCD grade and thickness to achieve target Q-factors and resonant frequencies for similar high-frequency acoustic sensor projects.
  • Design Optimization: Providing data and support for modeling the acoustic impedance mismatch to maximize gravimetric sensitivity, particularly for novel thin-film materials.

For custom specifications or material consultation, visit 6ccvd.com or contact our engineering team directly.

View Original Abstract

New theoretical and experimental results of microwave acoustic wave propagation in diamond-based multilayer piezoelectric structures (MPS) as “Me1/(Al,Sc)N/Me2/(100) diamond/Me3” and “Me1/AlN/Me2/(100) diamond/Me3” under three metal film depositions, including the change in the quality factor Q as a result of Me3 impact, were obtained. Further development of our earlier studies was motivated by the necessity of creating a sensor model based on the above fifth layered MPS and its in-depth study using the finite element method (FEM). Experimental results on the change in operational checkpoint frequencies and quality factors under the effect of film deposition are in satisfactory accordance with FEM data. The relatively small decrease in the quality factor of diamond-based high overtone bulk acoustic resonator (HBAR) under the metal layer effect observed in a wide microwave band could be qualified as an important result. Changes in operational resonant frequencies vs. film thickness were found to have sufficient distinctions. This fact can be quite explained in terms of the difference between acoustic impedances of diamond and deposited metal films.

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  5. 1959 - Verwendung von Schwingquarzen zur Wägung dünner Schichten und zur Mikrowägung [Crossref]
  6. 1972 - Investigation of film-thickness determination by oscillating quartz resonators with large mass load [Crossref]
  7. 1993 - Quartz crystal microbalance for the detection of microgram quantities of human serum albumin: Relationship between the frequency change and the mass of protein adsorbed [Crossref]
  8. 2016 - Progresses on the theory and application of quartz crystal microbalance [Crossref]
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  10. 2008 - Highly sensitive mass sensor using film bulk acoustic resonator [Crossref]