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Engineering the collapse of lifetime distribution of nitrogen-vacancy centers in nanodiamonds

MetadataDetails
Publication Date2021-06-28
JournalApplied Physics Letters
AuthorsH. Li, J.Y. Ou, B. Gholipour, J.K. So, D. Piccinotti
InstitutionsNanyang Technological University, University of Southampton
Citations3
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Technical Documentation & Analysis: Engineering the Collapse of Lifetime Distribution of Nitrogen-Vacancy Centers in Nanodiamonds

Section titled “Technical Documentation & Analysis: Engineering the Collapse of Lifetime Distribution of Nitrogen-Vacancy Centers in Nanodiamonds”

This document analyzes the research demonstrating active control over Nitrogen-Vacancy (NV) center emission statistics using chalcogenide thin films, and outlines how 6CCVD’s advanced MPCVD diamond materials can accelerate and scale this quantum technology.


  • Core Achievement: Experimental demonstration of a dramatic collapse in the lifetime distribution of NV centers in nanodiamonds (NDs) by embedding them in thin chalcogenide (SbTe) films.
  • Quantified Improvement: The lifetime distribution spread was narrowed by over five times, reducing from >7 ns (reference sample) to approximately 1 ns (embedded sample).
  • Lifetime Shortening: The average NV$^0$ lifetime was successfully shortened by a factor of two, converging to 11 ns across various dielectric environments.
  • Underlying Mechanism: The narrowing is enforced by substantially increased non-radiative decay, which dominates relaxation and renders the total decay rate ($\gamma_{tot}$) insensitive to the random orientation of the NV center’s electric dipole moment.
  • Material Control: The optical response of the host chalcogenide film can be continuously tuned (from strongly plasmonic to strongly dielectric) via stoichiometric engineering, offering a straightforward path to active control over emission statistics.
  • Application Potential: This method provides a scalable solution for creating highly uniform, stable single-photon sources, critical for integrated optical quantum platforms in sensing, communication, and computing.

The following hard data points were extracted from the research paper, focusing on material properties and performance metrics.

ParameterValueUnitContext
ND Average Size120nmNanodiamonds used (Sigma Aldrich)
NV$^0$ Centers per ND~1200CentersNeutral nitrogen-vacancy centers
NV$^0$ Zero Phonon Line (ZPL)575nmWavelength used for characterization
Reference Average LifetimeNearing 20nsNDs placed on SbTe film
Embedded Average Lifetime11nsNDs embedded in SbTe film
Lifetime Distribution Spread (Reference)>7nsNDs placed on SbTe film
Lifetime Distribution Spread (Embedded)~1nsAchieved in Strong/Weak Plasmonic (SPL/WPL) areas
SbTe Film Thickness Range ($d$)40 to 100nmOverall thickness after two deposition rounds
SbTe Real Permittivity (Re $\epsilon$)-23 to 13N/ATuned continuously across samples at 575 nm
SbTe Imaginary Permittivity (Im $\epsilon$)15 to 30N/AHigh loss component across all compositions
Non-Radiative Decay Enhancement (Parallel Dipole, SDL)>18Times higherND embedded vs. ND on SbTe
Non-Radiative/Radiative Ratio (Parallel Dipole, SDL)Approaching 174N/AMaximum ratio for embedded NDs

The experiment combined high-precision material synthesis with advanced optical characterization techniques.

  1. Substrate and Deposition: A 28 mm x 28 mm Silicon (Si) substrate was used. Thin SbTe films (thickness $d/2$, 20 to 50 nm) were deposited using a high-throughput Physical Vapor Deposition (PVD) system.
  2. PVD Conditions: Deposition occurred under high vacuum ($\le 10^{-8}$ mbar) at room temperature, utilizing off-axis Knudsen cell sources and fixed wedge shutters to create independent density gradients of high-purity Sb and Te ($\ge 99.9999$ %).
  3. ND Integration: Nanodiamonds (120 nm average size) were dispersed in methanol via ultrasonic bath and drop-cast onto the first SbTe film.
  4. Embedding Layer: A second SbTe film (thickness $d/2$) was deposited over the ND layer using the same PVD procedure, resulting in an overall embedded film thickness $d$ ranging from 40 nm to 100 nm.
  5. Optical Characterization: Complex permittivity ($\epsilon$) of the SbTe films was mapped across the sample using variable angle spectroscopic ellipsometry at the NV$^0$ zero phonon line wavelength (575 nm).
  6. Lifetime Measurement: Time-Resolved Cathodoluminescence (TR-CL) was performed using a Scanning Electron Microscope (SEM) operating at 10 kV with pulsed electron beam modulation for time-correlated single-photon counting.
  7. Data Extraction: Lifetimes of NV$^0$ centers were extracted by fitting the time-correlated histograms with a bi-exponential function.

This research validates a critical step toward realizing scalable, integrated quantum platforms based on diamond NV centers. 6CCVD provides the foundational MPCVD diamond materials and engineering services required to transition this research from proof-of-concept to robust, integrated devices.

The high-quality nanodiamonds used in this study are typically derived from high-purity single crystal diamond (SCD). For integrated quantum devices, the substrate itself must offer superior optical and thermal management.

Research Requirement6CCVD Material RecommendationTechnical Rationale
High-Purity NV SourceOptical Grade Single Crystal Diamond (SCD)Provides the lowest strain and highest purity material necessary for creating stable, high-coherence NV centers, whether used as bulk substrates or processed into high-quality NDs.
Integrated Sensing/ComputingElectronic Grade Polycrystalline Diamond (PCD)For large-area integration (up to 125mm), PCD offers superior thermal conductivity and mechanical stability compared to Si, crucial for managing heat dissipation in active chalcogenide films.
Active Electrical TuningBoron-Doped Diamond (BDD) SubstratesBDD acts as a conductive electrode platform, enabling direct electrical control over the phase-change chalcogenide film (SbTe) for dynamic tuning of the NV decay rates.

The integration of thin films and nanostructures requires precise control over substrate dimensions, surface quality, and electrode placement. 6CCVD’s in-house capabilities directly address these needs:

  • Custom Dimensions: We supply SCD plates and PCD wafers in custom dimensions up to 125mm diameter, supporting the scale-up of integrated quantum devices beyond the 28 mm x 28 mm Si substrate used in the paper.
  • Thickness Control: We offer precise thickness control for SCD (0.1”m to 500”m) and robust diamond substrates up to 10mm thick, providing flexibility for various optical coupling and thermal management schemes.
  • Ultra-Low Roughness Polishing: Achieving uniform thin-film deposition (like the 40-100 nm SbTe film) is critical. 6CCVD guarantees surface roughness of Ra < 1nm for SCD and Ra < 5nm for inch-size PCD, minimizing surface-induced non-radiative losses.
  • Custom Metalization: The conclusion suggests active control via electrical or thermal switching. We offer internal metalization services (Au, Pt, Pd, Ti, W, Cu) for integrating electrodes directly onto the diamond substrate, facilitating electrical tuning of the chalcogenide phase.

6CCVD’s in-house PhD team specializes in MPCVD growth and post-processing of diamond for quantum and electronic applications. We provide expert consultation on:

  • Material Selection: Assisting researchers in selecting the optimal diamond grade (SCD vs. PCD, doping level, orientation) to maximize NV center stability and coherence for similar Integrated Quantum Photonic projects.
  • NV Creation: Advising on nitrogen incorporation strategies during growth or post-growth implantation/annealing to optimize NV concentration and charge state.
  • Integration Challenges: Providing technical support for bonding, thin-film deposition, and laser cutting to ensure successful integration of complex material stacks like the ND/chalcogenide system onto diamond platforms.

For custom specifications or material consultation, visit 6ccvd.com or contact our engineering team directly.

View Original Abstract

We demonstrate experimentally that the distribution of the decay rates of nitrogen-vacancy centers in diamond becomes narrower by over five times for nanodiamonds embedded in thin chalcogenide films.

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