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Systematic high-level design of a fifth order Continuous-Time CRFF Delta Sigma ADC

MetadataDetails
Publication Date2021-02-21
AuthorsM. Germain, F. Rarbi, O. Rossetto
InstitutionsUniversité Grenoble Alpes
AnalysisFull AI Review Included

Technical Documentation & Analysis: High-Level Design of a CT Delta Sigma ADC for Diamond Detectors

Section titled “Technical Documentation & Analysis: High-Level Design of a CT Delta Sigma ADC for Diamond Detectors”

This document analyzes the requirements set forth in the paper “Systematic high-level design of a fifth order Continuous-Time CRFF Delta Sigma ADC,” focusing specifically on the material science implications for the underlying diamond detector technology.


This research details the systematic design of a high-performance Continuous-Time Delta Sigma ADC (CT ΔΣ ADC) intended for next-generation particle detectors based on diamond. The core value proposition and material requirements are summarized below:

  • Application Focus: The ADC is designed for energy measurement systems used in particle identification, specifically targeting detectors built upon diamond substrates.
  • Performance Achieved: The proposed 5th order Cascaded Resonators Feedforward (CRFF) architecture achieved a simulated Effective Number of Bits (ENOB) of 11.9 bits (73.5 dB SQNR) at a 40 MHz bandwidth.
  • Critical Challenge: The design exhibits extreme sensitivity to component dispersion (process variation of R and C values in Opamp-RC integrators), requiring tolerances as tight as ±10% process variation (Δp) and ±0.5% mismatch (ÎŽm) for critical loop coefficients.
  • Material Requirement: The successful implementation of the overall system hinges on the use of high-purity, stable diamond material, which serves as the primary sensing element for particle detection.
  • 6CCVD Value Proposition: 6CCVD provides the necessary high-quality, ultra-low defect density Single Crystal Diamond (SCD) substrates required to ensure the stability and performance demanded by these high-speed, low-noise front-end electronics.

The following hard data points were extracted from the synthesis and simulation results of the proposed CT ΔΣ ADC modulator:

ParameterValueUnitContext
Target Resolution10bitsRequired ENOB
Simulated ENOB11.9bitsAchieved performance
Signal Bandwidth (BW)40MHzTarget specification
Sampling Frequency (Fs)640MHzOSR = 8
Theoretical SQNR80dBCalculated maximum
Simulated SQNR (Ideal)73.5dBAchieved performance
Loop Filter Order (L)5-CRFF Architecture
Modulator ADC N3bitsQuantizer resolution
Integrator DC Gain40dBRequired for Opamp-RC integrators
Integrator Saturation Voltage±450mVMaximum output swing limit
Critical Process Variation (Δp)< 10%Required tolerance for R/C stability
Critical Mismatch Error (ÎŽm)< 0.5%Required tolerance for R/C stability

The systematic high-level design utilized a model-based approach combining graphical behavioral simulation with custom MATLAB scripts to optimize the CT ΔΣ modulator for diamond detector applications.

  1. Specification Definition: Target specifications (10-bit ENOB, 40 MHz BW) were defined, leading to the selection of a low OverSampling Ratio (OSR) of 8 and a high sampling frequency (640 MHz).
  2. Architecture Selection: The Cascaded Resonators Feedforward (CRFF) architecture was chosen due to its wide bandwidth, low OSR capability, and ability to limit noise and distortion through large bias currents in the first stage.
  3. Synthesis and Modeling: The modulator was synthesized using Schreier’s Toolbox integrated into a SIMULINK graphical behavioral model.
  4. Systematic Dispersion Analysis: Custom MATLAB scripts were integrated to perform parametric Monte Carlo simulations (10,000 iterations) to analyze the effect of component dispersion (process variation Δp and mismatch ήm) on the final SQNR.
  5. Critical Parameter Identification: Simulations identified the loop coefficients (a1, a2, b1, c1) as the most critical parameters, requiring extremely tight tolerance control (Δp < 10%, ήm < 0.5%) to maintain desired specifications.

The successful deployment of this high-speed ADC relies on the performance and stability of the underlying diamond detector. 6CCVD provides the specialized MPCVD diamond materials and engineering services necessary to meet the stringent requirements of next-generation particle physics instrumentation.

The application—energy measurement and particle identification—demands materials with exceptional charge transport properties, high radiation hardness, and low intrinsic noise.

6CCVD MaterialRecommended GradeRationale for Application
Single Crystal Diamond (SCD)Optical/Detector GradeEssential for high-performance particle detection. Offers the highest purity, lowest defect density, and superior charge collection efficiency (CCE) required for stable, low-noise signal generation feeding the CT ΔΣ ADC.
Boron-Doped Diamond (BDD)Heavy Doping (p-type)Used for creating highly conductive electrodes directly on the diamond surface, eliminating the need for complex metal contacts in certain detector designs, thereby reducing interface noise and improving long-term stability.
Polycrystalline Diamond (PCD)High Purity (HPHT/MPCVD)Suitable for large-area support substrates (up to 125mm) or applications where the diamond acts as a stable, high-thermal-conductivity heat spreader for the integrated CMOS electronics.

The integration of the high-speed Opamp-RC integrators and the diamond sensor requires precise material engineering and interface control. 6CCVD offers comprehensive customization services to facilitate this integration:

  • Custom Dimensions: We supply SCD plates up to 10mm thick and PCD wafers up to 125mm in diameter, allowing for large-area detector arrays or integrated sensor/electronics platforms.
  • Precision Polishing: SCD substrates can be polished to an ultra-smooth surface finish (Ra < 1nm), critical for minimizing surface defects and ensuring optimal deposition of subsequent metalization layers or CMOS components.
  • Advanced Metalization: The integration of the front-end electronics requires robust, low-resistance contacts. 6CCVD offers in-house deposition of critical metal stacks, including:
    • Ti/Pt/Au: Standard stack for robust, low-resistance ohmic contacts.
    • W/Cu: High-thermal-conductivity stacks for heat dissipation in high-power applications.
  • Thickness Control: SCD and PCD layers can be grown and processed to precise thicknesses ranging from 0.1”m to 500”m, enabling optimization of detector capacitance and charge collection depth.

The paper highlights that the primary challenge is minimizing component dispersion to maintain high SQNR. While this relates to CMOS fabrication, the stability of the diamond detector itself is the foundation.

  • Material Selection Consultation: 6CCVD’s in-house PhD team specializes in diamond physics and detector design. We assist engineers in selecting the optimal diamond grade (e.g., specific nitrogen concentration, defect density) to minimize intrinsic noise and maximize signal fidelity for Particle Identification and Energy Measurement projects.
  • Interface Optimization: We provide technical guidance on surface preparation and metalization schemes to ensure stable, low-noise interfaces between the diamond sensor and the high-speed analog front-end (AFE) electronics described in this research.
  • Global Logistics: We ensure reliable, fast global shipping (DDU default, DDP available) for time-critical research and development projects.

For custom specifications or material consultation regarding high-performance diamond detectors and integrated electronics, visit 6ccvd.com or contact our engineering team directly.

View Original Abstract

In this paper we present the development of a Systematic high level design model based on MATLAB scripts. It is integrated into a graphical behavioral model toolbox for the synthesis and simulation of a Continuous-Time Delta Sigma ADC. For this, we decided to use a Model-based design approach which it is adopted to address problems associated with designing complex control and signal processing systems such as the case of Continuous-Time Delta Sigma ADC. The goal of our study is the design of a 10 bit ENOB ADC for energy measurement systems used in particle identification through a new generation of detectors based on diamond. Results of the synthesis of a proposed fifth order Continuous-Time Delta Sigma ADC modulator for 10-bit ENOB ADC based on a Cascaded Resonators Feedforward architecture and simulations of the dispersion of its components (due to fabrication process) using the proposed tool are demonstrated and discussed.