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Long-Term Spin State Storage Using Ancilla Charge Memories

MetadataDetails
Publication Date2020-12-01
JournalPhysical Review Letters
AuthorsHarishankar Jayakumar, Artur Lozovoi, Damon Daw, Carlos A. Meriles
InstitutionsCity College of New York, The Graduate Center, CUNY
Citations13
AnalysisFull AI Review Included

Technical Documentation & Analysis: Ancilla-Aided Spin State Storage in MPCVD Diamond

Section titled “Technical Documentation & Analysis: Ancilla-Aided Spin State Storage in MPCVD Diamond”

This document analyzes the research paper “Long-term spin state storage using ancilla charge memories” to provide technical specifications and align the material requirements with 6CCVD’s advanced MPCVD diamond capabilities, driving sales to researchers and engineers in quantum technology.


  • Core Achievement: Demonstration of Ancilla-Aided Integrated Detection (AID) for long-term storage and readout of Nitrogen-Vacancy (NV) center spin states in bulk CVD diamond.
  • Mechanism: NV spin information is converted into stable charge states (electrons/holes) via Spin-to-Charge Conversion (SCC), which are subsequently captured by neighboring defects (Silicon-Vacancy, SiV, or ancilla NV centers) acting as charge memories.
  • Material Requirements: The protocol necessitates high-purity <100> CVD diamond with precise, controlled concentrations of both NV (qubit) and SiV (ancilla) defects, typically in the 10-2 to 10-1 ppm range.
  • Readout Enhancement: AID offers a pathway to potentially boost sensitivity beyond standard optical sensing (SOS) by integrating the signal over long time intervals (up to 2 s demonstrated) due to the unlimited lifetime of trapped charge states.
  • Integrated Platform: The methodology combines magnetic resonance (MW pulses) and multi-color confocal microscopy (520 nm/632 nm lasers) with integrated charge traps, establishing a robust platform for color-center-based quantum metrology and information processing.
  • 6CCVD Value Proposition: 6CCVD specializes in providing the necessary Optical Grade Single Crystal Diamond (SCD) with custom, controlled doping (N and Si) and integrated metalization required to replicate and scale this advanced quantum sensing technique.

The following hard data points were extracted from the experimental section and supplementary notes, detailing the material and operational parameters.

ParameterValueUnitContext
Diamond Crystal Orientation<100>N/ACVD grown bulk diamond
NV Concentration (Qubit/Ancilla)10-2ppmUsed in Sample 1 (Fig 1-2)
SiV Concentration (Ancilla Traps)10-1ppmUsed in Sample 1 (Fig 1-2)
Substitutional N Concentration1ppmBackground defects in both samples
MW Frequency (Resonant)2.87GHzNV crystal-field resonance
MW/SCC Pulse Duration100nsSpin manipulation and conversion
Green Laser Wavelength (L1)520nmUsed for Initialization and SCC
Red Laser Wavelength (L2)632nmUsed for Initialization, SCC, and Readout
Green Laser Power (L1)3mWTypical power during initialization/SCC
Red Laser Power (L2)Up to 21mWMaximum power during SCC
Electron Diffusion Coefficient (Dn)6.1 * 109”m2/sAmbient conditions (T=293 K)
Hole Diffusion Coefficient (Dp)5.3 * 109”m2/sAmbient conditions (T=293 K)
Signal Integration TimeUp to 2sDemonstrated long-term charge storage
Optical Illumination Spot Size~1”mDiameter of laser illumination

The experiment relies on precise control over defect charge states, spin manipulation, and carrier dynamics in the diamond lattice.

  1. Material Preparation: Utilization of high-p-urity <100> CVD diamond with specific, low concentrations of NV, SiV, and substitutional Nitrogen impurities, purchased from commercial suppliers.
  2. Microwave (MW) Delivery: MW pulses are applied via an omega-shaped stripline (0.5 mm diameter) imprinted directly onto the diamond substrate, enabling resonant spin manipulation (2.87 GHz).
  3. Optical Setup: A home-built confocal microscope with an air objective (NA=0.7) is used, employing 520 nm (Green) and 632 nm (Red) diode lasers for excitation and a single photon counting module (SPCM) for photoluminescence (PL) detection (filtered 650 nm to 800 nm).
  4. Charge Initialization: Raster scanning using red laser pulses (632 nm) to prepare NVs and SiVs within a 40x40 ”m2 area into a non-fluorescent (dark) charge state.
  5. Spin-to-Charge Conversion (SCC): The qubit NV spin state is converted to a charge state via simultaneous 520 nm and 632 nm pulses (100 ns), generating free electrons and holes conditional on the initial spin state (|ms = 0> vs. |ms = ±1>).
  6. Ancilla Trapping: Generated carriers diffuse away from the illumination spot and are captured by neighboring, carrier-type-selective ancilla traps (SiV or NV centers), which convert to a fluorescent (bright) charge state, storing the spin information.
  7. Integrated Readout (AID): The stored spin state is detected by measuring the integrated fluorescence of the activated ancilla ensemble over extended periods (up to 2 seconds).

This research highlights the critical need for highly controlled, customized diamond materials for advanced quantum applications. 6CCVD is uniquely positioned to supply the necessary SCD substrates, defect engineering, and integrated fabrication services.

To replicate and extend this research, 6CCVD recommends the following materials:

  • Optical Grade Single Crystal Diamond (SCD): Essential for minimizing background noise and maximizing the coherence time (T2) of the NV qubit. Our SCD material is grown via MPCVD, ensuring the highest purity and lowest intrinsic defect density.
  • Custom Doped SCD Wafers: Required for precise control over the concentration and ratio of active defects. We offer custom doping recipes to achieve the specific concentrations cited in the paper (e.g., 10-2 ppm NV, 10-1 ppm SiV, and controlled substitutional N) necessary for optimal SCC and AID performance.
  • Polycrystalline Diamond (PCD) Substrates: For scaling up integrated devices or creating large-area sensing arrays, 6CCVD offers PCD wafers up to 125 mm in diameter, polished to Ra < 5 nm.

The experimental setup requires integrated components and specific material geometries, all of which are standard offerings at 6CCVD:

Research Requirement6CCVD Customization ServiceSpecification Match
Integrated MW DeliveryCustom MetalizationIn-house deposition of Au, Pt, Pd, Ti, W, or Cu electrodes for fabricating omega-shaped striplines or complex electrode arrays for electrical readout.
High Optical QualityPrecision PolishingSCD surfaces polished to Ra < 1 nm, ensuring minimal scattering and optimal coupling for 520 nm/632 nm confocal excitation.
Specific ThicknessesCustom Thickness ControlSCD layers available from 0.1 ”m to 500 ”m, and robust substrates up to 10 mm thick for mechanical and thermal stability.
Custom GeometryLaser Cutting & ShapingPrecise laser cutting services to achieve custom plate dimensions or specific geometries required for mounting and integration into cryogenic or high-power setups.

The success of Ancilla-Aided Detection (AID) hinges on optimizing the balance between qubit coherence, ancilla trap concentration, and carrier collection efficiency. 6CCVD’s in-house PhD team can assist with material selection and defect engineering protocols for similar Spin Qubit Readout and Quantum Metrology projects, ensuring optimal charge trap activation and minimizing the impact of background impurities (like substitutional Nitrogen).

For custom specifications or material consultation, visit 6ccvd.com or contact our engineering team directly.

View Original Abstract

We articulate confocal microscopy and electron spin resonance to implement spin-to-charge conversion in a small ensemble of nitrogen-vacancy (NV) centers in bulk diamond and demonstrate charge conversion of neighboring defects conditional on the NV spin state. We build on this observation to show time-resolved NV spin manipulation and ancilla-charge-aided NV spin state detection via integrated measurements. Our results hint at intriguing opportunities in the development of novel measurement strategies in fundamental science and quantum spintronics as well as in the search for enhanced forms of color-center-based metrology down to the limit of individual point defects.