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Generation of Tin-Vacancy Centers in Diamond via Shallow Ion Implantation and Subsequent Diamond Overgrowth

MetadataDetails
Publication Date2020-02-07
JournalNano Letters
AuthorsAlison E. Rugar, Haiyu Lu, Constantin Dory, Shuo Sun, Patrick J. McQuade
InstitutionsStanford University, SLAC National Accelerator Laboratory
Citations69
AnalysisFull AI Review Included

Technical Documentation: Generation of High-Quality Tin-Vacancy Centers via SIIG Diamond Overgrowth

Section titled “Technical Documentation: Generation of High-Quality Tin-Vacancy Centers via SIIG Diamond Overgrowth”

This documentation analyzes the research demonstrating the Shallow Ion Implantation and Growth (SIIG) method for generating high-quality, site-controlled Tin-Vacancy (SnV-) color centers in diamond, a critical advancement for solid-state quantum computing and nanophotonics.


  • Novel Method: Introduction of the Shallow Ion Implantation and Growth (SIIG) technique, which combines low-energy ion implantation with subsequent MPCVD diamond overgrowth.
  • Quality Achievement: SIIG successfully generated SnV- centers exhibiting clean bulk Photoluminescence (PL) spectra, notably suppressing extraneous emission peaks (631 nm and 647 nm) typically associated with lattice damage.
  • HPHT Avoidance: The high-quality results achieved via SIIG were previously only possible using complex High-Pressure High-Temperature (HPHT) annealing, making SIIG a simpler, more scalable alternative.
  • Site Control: The use of low-energy implantation (1 keV) allowed for precise, site-controlled generation using a simple, thin PMMA mask (~50 nm), compatible with existing nanophotonic fabrication techniques.
  • Lattice Healing: The MPCVD overgrowth layer (90 nm) effectively healed lattice damage and incorporated the implanted Sn atoms into the growing diamond lattice, forming low-strain SnV- centers.
  • Narrow Broadening: Optimized SIIG preparation (Sample C) achieved extremely narrow inhomogeneous broadening (as low as 101 ± 1 GHz), demonstrating high crystal quality around the emitters, suitable for techniques like Raman tuning.
  • Versatility: The method utilizes standard MPCVD growth conditions for pure diamond, suggesting high compatibility and potential extension to other Group-IV color centers (e.g., GeV, PbV).

The following hard data points were extracted from the SIIG methodology (Sample B and optimized Sample C):

ParameterValueUnitContext
Substrate MaterialElectronic Grade DiamondN/AStarting material (Single Crystal Diamond)
Initial Etch Depth500nmRemoved via O2 plasma etch
Implantation Species120Sn+N/ATin isotope used for color center creation
Implantation Energy (SIIG)1keVLow-energy implantation for shallow localization
Implantation Dose2 x 1013cm-2Standard dose used for both methods
Mask Thickness (PMMA)~ 50nmThin mask used for site control
MPCVD Overgrowth Thickness90nmLayer grown immediately after implantation
MPCVD Stage Temperature650°CGrowth temperature for lattice healing
MPCVD Microwave Power1100WPower setting (Seki Diamond Systems SDS 5010)
MPCVD Pressure23TorrGrowth pressure
Inhomogeneous Broadening (C-transition, Sample C)101 ± 1GHzFull Width at Half-Maximum (FWHM) at 5 K
Inhomogeneous Broadening (D-transition, Sample C)105 ± 2GHzFull Width at Half-Maximum (FWHM) at 5 K
Sn Ion Localization Depth~ 2nmCalculated depth of ions near surface

The Shallow Ion Implantation and Growth (SIIG) method involves the following critical steps for Sample B:

  1. Substrate Cleaning: Electronic grade diamond plates were subjected to a boiling tri-acid clean (1:1:1 sulfuric:nitric:perchloric acids).
  2. Surface Etch: A 500 nm layer of diamond was removed using an O2 plasma etch to ensure a clean starting surface.
  3. Mask Application: A thin layer (~50 nm) of poly(methyl methacrylate) (PMMA) was spin-coated onto the substrate.
  4. Patterning: The PMMA mask was patterned using electron-beam (e-beam) lithography to define arrays of holes (20 nm to 150 nm) for site-controlled implantation.
  5. Shallow Implantation: 120Sn+ ions were implanted at a low energy of 1 keV with a dose of 2 x 1013 cm-2.
  6. Mask Removal: The PMMA mask was chemically removed (Remover PG).
  7. Plasma Clean: The surface was cleaned using H2 plasma to remove sp2-bonded carbon resulting from implantation damage.
  8. MPCVD Overgrowth: A 90 nm thick diamond layer was grown immediately via MPCVD using the following recipe:
    • Stage Temperature: 650 °C
    • Microwave Power: 1100 W
    • Pressure: 23 Torr
    • Gas Flows: 300 sccm H2; 0.5 sccm CH4

The successful implementation of the SIIG method relies entirely on high-quality diamond substrates and precision MPCVD growth capabilities—6CCVD’s core expertise. We offer materials and services specifically tailored to replicate and advance this quantum research.

To replicate or extend this research, a high-purity, low-defect starting material is essential to minimize background noise and achieve the narrow inhomogeneous broadening demonstrated in the paper.

  • Recommendation: Optical Grade Single Crystal Diamond (SCD).
    • Our SCD wafers provide the ultra-low nitrogen and defect density required for quantum applications.
    • We offer SCD in thicknesses ranging from 0.1”m up to 500”m, suitable for initial etching and subsequent overgrowth.

The SIIG method critically depends on the quality and control of the CVD overgrowth layer to heal lattice damage and precisely position the $\delta$-doped layer of SnV- centers.

  • Precision Epitaxial Growth: 6CCVD specializes in Custom MPCVD Epitaxial Growth Services. We can precisely control the thickness of the overgrowth layer (e.g., 90 nm, as used in the study) and tailor growth parameters (temperature, pressure, gas ratios) to optimize defect incorporation and lattice healing, ensuring the low-strain environment necessary for high-quality SnV- centers.
  • Custom Dimensions and Shaping: We offer advanced laser cutting and shaping services to produce chips, plates, or wafers up to 125mm (PCD) or custom SCD dimensions, ready for e-beam lithography and subsequent nanophotonic device fabrication (e.g., nanocavities, nanobeams).
  • Metalization for Device Integration: For researchers integrating these color centers into functional nanophotonic devices, 6CCVD provides In-House Metalization Services (Au, Pt, Pd, Ti, W, Cu) to deposit contacts directly onto the diamond surface.

The optimization of the SIIG process (as seen in the contrast between Sample B and Sample C) highlights the importance of expert material preparation and recipe tuning.

  • Expert Consultation: 6CCVD’s in-house PhD team can assist with material selection and process optimization for similar Group-IV Color Center Generation projects (SnV-, GeV-, PbV-). We provide authoritative guidance on achieving optimal substrate quality, etch depths, and growth recipes to minimize inhomogeneous broadening and maximize emitter quality.

For custom specifications or material consultation, visit 6ccvd.com or contact our engineering team directly.

View Original Abstract

Group IV color centers in diamond have garnered great interest for their potential as optically active solid-state spin qubits. The future utilization of such emitters requires the development of precise site-controlled emitter generation techniques that are compatible with high-quality nanophotonic devices. This task is more challenging for color centers with large group IV impurity atoms, which are otherwise promising because of their predicted long spin coherence times without a dilution refrigerator. For example, when applied to the negatively charged tin-vacancy (SnV<sup>-</sup>) center, conventional site-controlled color center generation methods either damage the diamond surface or yield bulk spectra with unexplained features. Here we demonstrate a novel method to generate site-controlled SnV<sup>-</sup> centers with clean bulk spectra. We shallowly implant Sn ions through a thin implantation mask and subsequently grow a layer of diamond via chemical vapor deposition. This method can be extended to other color centers and integrated with quantum nanophotonic device fabrication.