Testing of a Prototype Detector of Heavy Charged Particles Based on Diamond Epitaxial Films Obtained by Gas-Phase Deposition
At a Glance
Section titled “At a Glance”| Metadata | Details |
|---|---|
| Publication Date | 2019-08-06 |
| Journal | Instruments and Experimental Techniques |
| Authors | С. В. Черных, С. А. Тарелкин, А. В. Черных, S. Yu. Troschiev, Nikolay V. Luparev |
| Institutions | National University of Science and Technology, Technological Institute for Superhard and Novel Carbon Materials |
| Citations | 1 |
Abstract
Section titled “Abstract”The results of testing a prototype of a surface-barrier detector of charged particles based on single-crystal epitaxial layers of diamond are presented. Diamond films with p-type conduction with a boron concentration of (4-8) × 1014 cm-3 65 μm thick were grown using gas-phase deposition on heavily doped diamond substrates grown at high pressure and high temperature. A 17 mm2 Schottky barrier was formed by sputtering Pt with a thickness of 30 nm. When irradiated from the 238Pu α-source (the 5.499 keV line) a detector with an external bias of 90 V demonstrated a charge collection efficiency close to 100% and a FWHM high energy resolution of 0.56%. The obtained energy resolution is at the level of standard silicon detectors.