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Enhanced radiation hardness and signal recovery in thin diamond detectors

MetadataDetails
Publication Date2019-02-01
JournalAIP Advances
AuthorsN. Skukan, I. Sudić, M. Pomorski, Wataru Kada, M. JakÅ”ić
InstitutionsGunma University, CEA LIST
Citations12

Using the advantage of the high spatial resolution of the Ruđer BoÅ”ković Institute (RBI) ion microprobe, small areas of a thin membrane single crystal chemical vapor deposition (scCVD) diamond detector were intentionally damaged with a high-intensity 26-MeV oxygen ion beam at various fluences, producing up to ∼1018 vacancies/cm3. The response of the detector was tested with the ion beam-induced charge technique (IBIC) using a 2-MeV proton beam as a probe. The signal amplitudes decreased down to approximately 50% of the original value at low electric fields (<10 V/μm) inside the detector. However, the increase of electric field to values of ∼100 V/μm completely recovers the signal amplitude. The results presented herein can facilitate the development of true radiation hard particle detectors.

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  2. 2007 - A review of ion beam induced charge microscopy [Crossref]