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Boron Doped Ultrananocrystalline Diamond Films on Porous Silicon - Morphological, Structural and Electrochemical Characterizations

MetadataDetails
Publication Date2015-11-20
JournalMaterials Research
AuthorsLilian Mieko da Silva, Marta dos Santos, MaurĂ­cio Ribeiro Baldan, A.F. Beloto, N.G. Ferreira
InstitutionsNational Institute for Space Research
Citations10
AnalysisFull AI Review Included

Technical Documentation and Analysis: Boron Doped Ultrananocrystalline Diamond Films

Section titled “Technical Documentation and Analysis: Boron Doped Ultrananocrystalline Diamond Films”

This study successfully demonstrates the fabrication and characterization of Boron-Doped Ultrananocrystalline Diamond (BDUND) films deposited onto Porous Silicon (PS) substrates via Hot Filament Chemical Vapor Deposition (HFCVD). The core findings drive immediate interest for high-performance electrochemical applications:

  • Exceptional Capacitance Achieved: BDUND/PS electrodes exhibit a high electrochemical capacitance of up to $6500 \mu\text{F}\cdot\text{cm}^{-2}$ (geometric area basis) at $0.8 \text{ V} \times \text{Ag/AgCl}$.
  • Performance Benchmark: This capacitance value is confirmed to be more than 20 times higher than that of standard planar BDD/Si electrodes and approximately 30 times greater than comparable nanohoneycomb diamond structures.
  • Material Morphology: Structural analysis (FEG-SEM, XRD, Raman) confirms the formation of ultrananocrystalline diamond (UNCD) with a fine average grain size of $\sim 5 \text{ nm}$.
  • Substrate Conformation: The BDUND film successfully coated the highly porous PS substrate, covering the pore walls and bottom surfaces while maintaining the critical high-surface-area porous morphology.
  • Application Potential: The demonstrated high capacitance strongly confirms that BDUND/PS composites are highly promising candidates for next-generation, high-density electrochemical capacitors (supercapacitors).
  • Process Parameters: Films were synthesized using a high boron doping ratio (20000 ppm B/C in solution) under low pressure (30 Torr) HFCVD, demonstrating a robust recipe for producing conductive, high-surface-area UNCD structures.

The following hard data points were extracted from the synthesis and characterization of the BDUND/PS electrodes.

ParameterValueUnitContext
Substrate Typen-type Monocrystalline Silicon (100)N/AResistivity: $1\text{-}20\ \Omega\cdot\text{cm}$
CVD TechniqueHot Filament CVD (HFCVD)N/AUsed Tungsten filaments, $125\ \mu\text{m}$ diameter
Boron Doping Ratio20000ppm (B/C in solution)Used $\text{B}{2}\text{O}{3}$ dissolved in methanol bubbler
Reactor Pressure30TorrConstant pressure during growth
Filament Current15AApplied to linear tungsten filaments
Growth Time (Sample 1)3hOptimized for highest capacitance
Growth Time (Sample 2)4hShowed slight capacitance decrease vs. 3h sample
Gas Flow (3h Sample)$18 / 1.5 / 80$sccm$\text{H}{2} / \text{CH}{4} / \text{Ar}$ ratio
Gas Flow (4h Sample)$18.5 / 1.0 / 80$sccm$\text{H}{2} / \text{CH}{4} / \text{Ar}$ ratio
Average Grain Size$\sim 5$nmCalculated from X-ray $\lt 111\gt$ peak broadening
Grain Agglomerate Size$\sim 240$nmObserved via FEG-SEM
Electrolyte$0.5 \text{ mol/L } \text{H}{2}\text{SO}{4}$N/AUsed for Cyclic Voltammetry (CV)
CV Scan Rate50$\text{mV/s}$Used for electrochemical characterization
Maximum Capacitance (3h)6500$\mu\text{F}\cdot\text{cm}^{-2}$At $0.8 \text{ V} \times \text{Ag/AgCl}$ (geometric area)
Capacitance Improvement20xFactorRelative to planar BDUND/Si control
Raman D Band Peak1345$\text{cm}<sup>-1</sup>$Associated with $\text{sp}^{2}$ disorder (UNCD feature)
Raman G Band Peak1550$\text{cm}<sup>-1</sup>$Associated with $\text{sp}^{2}$ amorphous carbon

The synthesis involved a critical two-step process: preparation of the porous substrate followed by boron-doped ultrananocrystalline diamond growth.

  1. Porous Silicon (PS) Substrate Preparation:

    • Starting Material: n-type monocrystalline silicon wafers (100) with $1\text{-}20\ \Omega\cdot\text{cm}$ resistivity.
    • Ohmic Contact: Silicon backside covered with Indium to ensure good ohmic contact.
    • Etching Process: Electrochemical etching performed using HF-acetonitrile solution as the electrolyte.
    • Anodization: Samples polarized under galvanostatic conditions at a current density of $56.5\ \text{mA/cm}^{2}$ for 120 minutes, enhanced by a 50 W dichroic lamp.
    • Cleaning: Rinsed in deionized water and dried using nitrogen gas.
  2. BDUND Seeding (Pretreatment):

    • The PS substrates were pretreated using a self-assembly seeding method.
    • Substrates were immersed in a solution containing PDDA polymer, KCl colloidal solution, and $4 \text{ nm}$ diamond particles.
  3. BDUND Film Growth (HFCVD):

    • Reactor Type: Hot Filament Chemical Vapor Deposition (HFCVD).
    • Filaments: Five linear tungsten wires ($125\ \mu\text{m}$ diameter) spaced $7\ \text{mm}$ apart, operating at 15 A.
    • Doping Method: Boron introduction via an additional hydrogen line passing through a bubbler containing $\text{B}{2}\text{O}{3}$ dissolved in methanol. The target $\text{B/C}$ ratio in solution was $20000\ \text{ppm}$.
    • Recipe 1 (3h): $\text{H}{2}/\text{CH}{4}/\text{Ar}$ flow rates: $18 / 1.5 / 80\ \text{sccm}$.
    • Recipe 2 (4h): $\text{H}{2}/\text{CH}{4}/\text{Ar}$ flow rates: $18.5 / 1.0 / 80\ \text{sccm}$.
    • Pressure: Maintained at 30 Torr.
  4. Characterization:

    • Morphology: Scanning Electron Microscopy (SEM) and Field Emission Gun (FEG)-SEM were used to confirm uniform UNCD coalescence and the preservation of the PS porous structure.
    • Structure/Quality: Raman spectroscopy and high-resolution X-ray diffraction (XRD) were used to confirm diamond crystallinity ($\lt 111\gt$, $\lt 220\gt$, $\lt 311\gt$ peaks) and ultrananocrystalline features (D and G bands).
    • Electrochemical: Cyclic Voltammetry (CV) performed using a standard three-electrode system (sample, platinum counter, $\text{Ag/AgCl}$ reference) in $0.5 \text{ mol/L } \text{H}{2}\text{SO}{4}$ to determine capacitance.

This research validates high-surface-area, heavily boron-doped diamond as a superior material platform for energy storage devices. 6CCVD is uniquely positioned to supply and enhance the materials required to replicate and scale this highly successful research endeavor.

To replicate the high conductivity and electrochemical activity demonstrated in this paper, 6CCVD recommends materials with tailored dopant levels and crystalline structure control:

  • Heavy Boron-Doped Polycrystalline Diamond (BDD PCD): Suitable for large-scale electrode manufacturing where a very high surface area and conductivity are paramount. 6CCVD offers PCD wafers up to 125mm in diameter—ideal for scaling capacitor prototypes beyond lab-bench dimensions.
  • Ultrananocrystalline Diamond (UNCD) Services: While the paper used HFCVD, 6CCVD’s advanced MPCVD reactors allow precise control over gas mixtures ($\text{H}{2}/\text{Ar}/\text{CH}{4}$ ratios) and growth conditions necessary to synthesize highly uniform UNCD or Nanocrystalline Diamond (NCD) layers with controlled grain sizes (as small as $5\ \text{nm}$).
  • Custom Porous Substrate Growth: Although the paper utilized pre-etched PS, 6CCVD can perform MPCVD growth directly onto customer-supplied substrates (including patterned or porous structures) to maintain the delicate morphology required for maximum capacitance.

The optimization of BDUND/PS systems requires precise dimensional control, controlled thickness, and potential integration with external circuits.

Research Requirement6CCVD Custom CapabilityEngineering Advantage
Film ThicknessSCD or PCD layers from $0.1\ \mu\text{m}$ up to $500\ \mu\text{m}$Precise control over penetration depth and pore filling (key challenge noted in the paper).
Boron DopingPrecise, reproducible BDD doping control (B/C ratio)Ability to match the critical 20000 ppm level or explore specific electrochemical regimes.
Substrate SizePCD wafers available up to $125\ \text{mm}$ in diameterEnables scaling of electrochemical devices from research coupon size to full wafer production.
Electrode ContactInternal metalization capability: Au, Pt, Pd, Ti, W, CuEssential for reliable electrode integration and achieving stable ohmic contacts, often required after CVD growth.
Surface FinishPolishing services available (Ra < 5 nm for Inch-size PCD)While porous structure is desired here, 6CCVD can provide ultra-smooth finishes for adjacent layers or reference electrodes used in testing.

The challenges noted in the paper—such as obtaining a BDUND layer that promotes a uniform film while maintaining porous morphology—require sophisticated CVD expertise.

6CCVD’s in-house PhD team can provide expert consultation on material selection, recipe optimization (e.g., precise $\text{H}{2}/\text{CH}{4}/\text{Ar}$ flow ratios for UNCD synthesis), and process design to prevent excessive pore filling. We specifically assist clients working on similar electrochemical capacitor (supercapacitor) and high-surface-area electrode projects, leveraging our deep experience in tailored diamond growth on complex substrates.

For custom specifications or material consultation, visit 6ccvd.com or contact our engineering team directly. We offer global shipping (DDU default, DDP available) for seamless delivery of critical research materials.

View Original Abstract

Boron doped ultrananocrystalline diamond (BDUND) films were grown and characterized on porous silicon (PS) substrates. PS samples were prepared from n-type monocrystalline silicon wafers (100) with 1-20 Ω.cm of resistivity, by electrochemical etching, using HF-acetonitrile solution as electrolyte. BDUND films were grown by Hot Filament Chemical Vapor Deposition using CH4, H2 and Ar. The doping process consisted of an additional hydrogen line, passing through a bubbler containing B2O3 dissolved in methanol, with boron/carbon ratio of 20000 ppm in solution. Raman spectroscopy and X-Ray diffraction were used to evaluate the quality of the films. Scanning electron microscopy was used for morphological characterization, and confirmed that the films covered the pores without filling them. Electrochemical response and capacitance behavior of the electrodes were explored, by cyclic voltammetry. Samples presented high capacitance, confirming that BDUND/PS electrodes are promising for application as electrochemical capacitors.

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