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Effect of Seed Size, Suspension Recycling and Substrate Pre-Treatment on the CVD Growth of Diamond Coatings

MetadataDetails
Publication Date2015-01-01
JournalOpen Journal of Applied Sciences
AuthorsA.K. Mallik, Sandip Bysakh, R. Bhar, Shlomo Rotter, Joana Catarina Mendes
InstitutionsJadavpur University, Central Glass and Ceramic Research Institute
Citations6
AnalysisFull AI Review Included

Technical Documentation & Analysis: Enhanced PCD Nucleation via NNP

Section titled “Technical Documentation & Analysis: Enhanced PCD Nucleation via NNP”

This documentation analyzes the key findings regarding diamond seed size, suspension management, and pre-treatment effects on MPCVD Polycrystalline Diamond (PCD) growth, positioning 6CCVD’s expertise and advanced material capabilities as the definitive solution for engineers and researchers in this field.


The research details a robust methodology (Novel Nucleation Process, NNP) for growing uniform PCD coatings on silicon, emphasizing the critical interplay between substrate pre-treatment and seeding characteristics.

  • Validated Process: The NNP (HFCVD Pre-Treatment + Ultrasonic Seeding + MPCVD Growth) is confirmed to significantly enhance PCD nucleation, enabling the deposition of uniform films.
  • Optimal Seeding Grit: Sub-micron diamond particles (0.25 ”m) were identified as the most effective seeding material, yielding grain sizes down to 1.21 ”m while maintaining high PCD quality.
  • High Film Quality Achieved: Optimized parameters produced high-quality PCD coatings with crystallinity ratings up to 94.93% (FWHM 3.40 cm-1) and minimal internal tensile stress (0.26 GPa).
  • Recycling Limitation: The study exposed a severe limitation in feedstock management: reusing the diamond seeding suspension more than five times drastically degrades film quality (down to 60%) and results in discontinuous substrate coverage.
  • Large Area Feasibility: The experiments utilized a 915 MHz, 8 kW MPCVD reactor, demonstrating scalability potential which directly aligns with 6CCVD’s large-area fabrication capabilities (up to 125 mm PCD).

The following hard data points define the optimal experimental parameters and material quality achieved in the reported study.

ParameterValueUnitContext
CVD Reactor Type (Growth)MPCVD(915 MHz)Lambda DT1800
Microwave Input Power (GC)8kWGrowth Condition (GC)
Substrate Temperature (GC)1050°CGrowth Condition (GC)
Chamber Pressure (GC)110TorrGrowth Condition (GC)
Gas Flow Ratio (CH4:H2)10 : 500sccmMethane:Hydrogen
Optimal Seeding Grit Size0.25”mSub-micron slurry
Substrate Pre-Treatment (PT)HFCVD(30 min)1% CH4/H2, 30 Torr, 600 °C
Highest PCD Quality94.93%Raman Quality (Sample 4-1)
Lowest FWHM (Crystallinity)3.40cm-1Excellent crystal quality
Lowest Internal Stress0.26GPaTensile (Sample 1-3)
Average Grain Size (Range)1.21 to 2.84”mDependent on grit size and suspension age
Recycling Limit (Before Failure)5cyclesSuspension reuse leads to quality drop (60%)

The synthesis employed a modified Novel Nucleation Process (NNP) involving three primary stages: Substrate Pre-Treatment, Ultrasonic Seeding, and Microwave Plasma CVD Growth.

  1. Substrate Preparation:

    • Material: p-type Silicon (Si) wafers, 0.5 mm thick, cut into 25 mm2 pieces.
    • Purpose: Silicon is chosen due to lattice compatibility and wide use in device fabrication.
  2. HFCVD Pre-Treatment (PT):

    • System: Hot Filament CVD (HFCVD).
    • Recipe: 30 minutes exposure under diamond growth conditions (1% CH4/H2 gas flow, 30 Torr pressure, 600 °C).
    • Effect: Forms a thin (10 - 15 nm) sp3 enriched carbon film on the Si surface, enhancing nucleation sites and reducing incubation time.
  3. Ultrasonic Seeding (US):

    • Suspensions: Five batches of diamond micron grits were prepared (0.25 ”m up to 40-60 ”m).
    • Procedure: Substrates (with and without PT) were seeded in an ultrasonic bath.
    • Test Parameter: Each suspension was reused ten successive times to evaluate the effect of suspension aging/recycling.
  4. Microwave Plasma CVD Growth (GC):

    • System: 915 MHz MPCVD reactor (DT1800).
    • Conditions: 10 sccm CH4 + 500 sccm H2 at 110 Torr, utilizing 8 kW microwave power, maintaining a 1050 °C substrate temperature.
    • Outcome: Synthesis of Polycrystalline Diamond (PCD) coatings.

6CCVD is uniquely positioned to assist researchers and industrial engineers in replicating and expanding upon this successful NNP methodology, particularly regarding large-area uniformity, high crystallinity, and custom substrate handling.

The requirements identified in this research are perfectly suited to 6CCVD’s core catalog and specialized materials:

  • MPCVD Polycrystalline Diamond (PCD) Wafers: 6CCVD offers high-quality PCD identical to the material synthesized in this study. We provide customizable thickness ranging from 0.1 ”m up to 500 ”m, suitable for high-power thermal management, protective coatings, and mechanical applications.
  • Heavy Boron-Doped Diamond (BDD): For researchers aiming to extend the NNP technique to electrochemical or sensing applications, 6CCVD supplies custom BDD films grown via MPCVD, ensuring uniform doping profiles essential for conductivity and stability.
  • High-Purity Substrates: While the paper used 25 mm2 Si pieces, 6CCVD routinely handles and processes large-area silicon and alternative substrate materials (e.g., Mo, W) for subsequent diamond deposition.

6CCVD’s advanced fabrication and post-processing capabilities directly address the scalability, surface finish, and integration challenges inherent in complex CVD diamond processes:

Requirement Addressed6CCVD CapabilityResearch Relevance
Large Area UniformityCustom dimensions up to 125 mm PCD wafers/plates.Directly enables scale-up from 25 mm2 pieces to industrial wafer sizes.
Surface QualityPrecision polishing services for PCD: Ra < 5 nm (for inch-size wafers).Ensures optimal surface finish for post-processing and device integration, often required after high-temp growth.
Material Thickness ControlSCD and PCD thickness control from 0.1 ”m to 500 ”m. Substrates up to 10 mm thickness.Allows precise control over film mechanical properties and thermal characteristics (e.g., thin films for sensors or thick films for heat sinks).
Device IntegrationIn-house custom metalization (Au, Pt, Pd, Ti, W, Cu) and precision laser cutting.Facilitates electrode creation or heat spreading layers, crucial for integrating PCD into device structures (addressing the PT layer function).

The findings regarding the rapid deterioration of seeding suspension effectiveness highlight the critical need for tight process control and high-quality feedstock management.

  • 6CCVD’s in-house PhD engineering team specializes in optimizing MPCVD recipes and pre-treatment protocols (like NNP) to maximize nucleation density and minimize material waste.
  • We offer consultation on selecting the ideal sub-micron diamond seed feedstock and developing proprietary slurry management protocols to ensure continuous, high-quality production of uniform, conformal PCD coatings, overcoming the recycling limitation identified in the paper.
  • We provide global support with DDU default shipping and DDP options available worldwide, simplifying logistics for international research programs.

For custom specifications or material consultation, visit 6ccvd.com or contact our engineering team directly.

View Original Abstract

CVD growth of uniform conformal polycrystalline diamond (PCD) coatings over complex three dimensional structures is very important material processing technique. It has been found that the nucleation and subsequent growth period is very critical for successful development of CVD diamond based technologies. There are many methods of enhancing diamond nucleation on foreign substrates-ultrasonic treatment with diamond seed suspension being the best among them. A combination of ultrasonic seeding (US) technique with prior treatment (PT) of the substrate under CVD diamond growth conditions for brief period of time, has found to be very effective in enhancing the diamond nucleation during CVD growth—together they are known as NNP. But successive usage of the same seeding suspension up to ten cycles deteriorates the seeding efficiency. 6th seeding cycle onwards the silicon substrates are barely get covered by diamond crystallites. Five different diamond micron grits were used for seeding the silicon substrates and it is observed that US with the sub-micron particles (0.25 ÎŒm) is very effective in efficient nucleation of PCD on Si substrates. PT of the substrate somewhat negates the effect of successive use of the same seeding slurry but it is best to avoid recycling of the same seeding suspension using micron size diamond grits.